Design, fabrication, and characterization of kinetic-inductive force sensors for scanning probe applications

• August K. Roos,
• Ermes Scarano,
• Elisabet K. Arvidsson,
• Erik Holmgren and
• David B. Haviland

Beilstein J. Nanotechnol. 2024, 15, 242–255, doi:10.3762/bjnano.15.23

• interferometric and beam-deflection detectors of motion are sufficient to resolve the thermal noise force determined by the damping of the cantilever eigenmode in thermal equilibrium with its environment. Operation in high vacuum and at cryogenic temperatures reduces this force noise, improving sensitivity to the

• power spectral density of fluctuations in force (force noise) SFF(ω), which sets a minimum detectable force (signal-to-noise ratio equals one) in a given measurement bandwidth, that is, signal integration time. The fluctuation–dissipation theorem applied to the harmonic oscillator gives where Tm is the

Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements

• Aaron Mascaro,
• Yoichi Miyahara,
• Tyler Enright,
• Omur E. Dagdeviren and
• Peter Grütter

Beilstein J. Nanotechnol. 2019, 10, 617–633, doi:10.3762/bjnano.10.62

Electrostatically actuated encased cantilevers

• Benoit X. E. Desbiolles,
• Gabriela Furlan,
• Adam M. Schwartzberg,
• Paul D. Ashby and
• Dominik Ziegler

Beilstein J. Nanotechnol. 2018, 9, 1381–1389, doi:10.3762/bjnano.9.130

• outperforms most other excitation methods. Conclusion: Compatible with any instrument using optical beam deflection detection electrostatic actuation in encased cantilevers combines ultra-low force noise with clean and stable excitation well-suited for quantitative measurements in liquid, compatible with air

Nonconservative current-driven dynamics: beyond the nanoscale

• Brian Cunningham,
• Tchavdar N. Todorov and
• Daniel Dundas

Beilstein J. Nanotechnol. 2015, 6, 2140–2147, doi:10.3762/bjnano.6.219

• the atomic motion, and introduce a contribution arising from the Berry phase [8]. Force noise is also excluded here. The vector containing the atomic displacements can then be expressed as where {} are the eigenvectors of the dynamical response matrix, with frequencies {ωj}, and the static

• atomic motion. Atoms obey Newtonian equations, with forces found from the time-evolving density matrix via Equation 1. This form of electron-ion dynamics is known as Ehrenfest dynamics. It captures all forces, equilibrium and nonequilibrium, with the exception of the force noise associated with

Improved atomic force microscopy cantilever performance by partial reflective coating

• Zeno Schumacher,
• Yoichi Miyahara,
• Laure Aeschimann and
• Peter Grütter

Beilstein J. Nanotechnol. 2015, 6, 1450–1456, doi:10.3762/bjnano.6.150

• damping of the cantilever, leading to a lower mechanical quality factor (Q-factor). In dynamic mode operation in high vacuum, a cantilever with a high Q-factor is desired in order to achieve a lower minimal detectable force. The reflective coating can also increase the low-frequency force noise. In

• contact mode and force spectroscopy, a cantilever with minimal low-frequency force noise is desirable. We present a study on cantilevers with a partial reflective coating on the detector side. For this study, soft (≈0.01 N/m) and stiff (≈28 N/m) rectangular cantilevers were used with a custom partial

• coating at the tip end of the cantilever. The Q-factor, the detection and the force noise of fully coated, partially coated and uncoated cantilevers are compared and force distance curves are shown. Our results show an improvement in low-frequency force noise and increased Q-factor for the partially

High-frequency multimodal atomic force microscopy

• Adrian P. Nievergelt,
• Jonathan D. Adams,
• Pascal D. Odermatt and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2014, 5, 2459–2467, doi:10.3762/bjnano.5.255

• spring constants [10][11][12]. Increasing the cantilever resonance frequency enables faster imaging and force spectroscopy [12][13][14][15][16][17], and small, high-frequency AFM cantilevers have less viscous drag, lowering force noise [18]. Many of the techniques for extracting mechanical information